In a high quality wafer, where would you expect defect-assisted recombination to be at a maximum?
Solution:
In a high quality wafer, the expectation of defect-assisted recombination to be at a maximum because,
Defect-assisted recombination occurs when an electron falls into a trap, an energy level within the bandgap caused by the presence of a foreign atom or a structural defect. Once the trap is filled it cannot accept another electron. The electron occupying the trap, in a second step, moves into an empty valence band state, thereby completing the recombination process. One can envision this process as a two-step transition of an electron from the conduction band to the valence band or as the annihilation of the electron and hole, which meet each other in the trap.
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