Question

Lateral force microscopy (LFM) is usually done with the fast scan direction perpendicular to the cantilever, instead of parallel to the cantilever.

Why is this so?

Answer 1

Solution:

In LFM for measuring both verical and lateral bending of cantilever is equipped with cantilever detection scheme, LFM data is used to monitor motions arising from forces on the cantilever that are parallel to the plane of the sample surface.

The vertical direction is preferred as it gives perpendicular analysis of frictional co-efficient, graphical representation are shown below,