Apart from GF AAS and direct titrations, describe three techniques for the analysis of metal ions.
X-ray Flurorescence (XRF)
XRF can be used to analyze the metal ions.
In XRF, an incident X-ray knocks out the core electrons of metal ions, this will leave a vacany in the inner-shell orbital of the metal ion.
The electron from an orbital of higher energy jumps into the vacant inner-shell orbital by emmiting a photon of wavelength corresponding to difference in energy.
The wavelength of x-ray photon thus, emitted will have information about the metal ion (mosley's law).
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