A new process for producing silicon wafers for integrated circuits is supposed to reduce the proportion of defectives to 8%. A sample of 200 wafers will be tested. Let X represent the number of defectives in the sample. Let p represent the population proportion of defectives produced by the new process. A test will be made of H0 : p ≥ 0.08 versus H1 : p < 0.08. Assume the true value of p is actually 0.04. How many wafers should be sampled so that the power is 0.90 if the test is made at the 5% level? Round the answer to the next largest integer.
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