The fraction of defective integrated circuits produced in a photolithography process is being studied. A random sample of 300 circuits is tested, revealing 18 defectives.
a Set up hypotheses for testing proportion defective as p = 0.04 versus p ∕= 0.04.
b Show formula and calculate the appropriate test statistic.
c Find the P-Value. Show formula/calculation and small sketch. Make a Conclusion using α = 0.05.
d Construct a 95% confidence interval.
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