A new process for producing silicon wafers for integrated
circuits is supposed to reduce the proportion of defectives to 12%.
A sample of 275 wafers will be tested. Let X represent the
number of defectives in the sample. Let p represent the
population proportion of defectives produced by the new process. A
test will be made of H0 : p ≥ 0.12
versus H1 : p < 0.12. Assume the
true value of p is actually 0.08.
a/ It is decided to reject H0 if X ≤
22. Use the normal approximation to the binomial to find the level
of this test. Find the level of this test.
b/ It is decided to reject H0 if X ≤
22. Use the normal approximation to the binomial to find the power
of this test. Find the power of this test.
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