Question

X-ray diffraction measurements on epitaxial YBa2Cu3O7 superconductor film grown on SrTiO3 substrates yields interplanar distance dooi = 1.1647 nm and d110 = 0.2733 nm. For strain-free YBa2Cu3O7, the interplanar distances are dooi = 1.1680 nm and d110 = 0.2724 nm. Determine the strain signs in the [001] and [110] directions.

Answer 1