An x-ray photoelectron spectroscopy (XPS) analysis is performed on a sample and peaks were detected at kinetic energies of 690, 720, 910 and 920 eV along with an Auger peak at 330 eV. Using the binding energies and characteristic x-ray tables of elements determine which material is used as the x-ray source and which material is the sample being characterized
Given that the peaks that detected at kinetic energies
of 690, 720, 910 and 920 eV along with an Auger peak at 330
eV.
Now since the photon energy is known we can transform the spectrum
such that the horizontal axix will be Binding energy.
Doing this it is observed that intense peak will be seen occuring
at binding energy corresponding to 335eV a sketch of it is shown
below.
This result is identical when x-ray source consists Mg
Kα radiation at energy( hν) = 1253.6 eV
The material that is being charaterized is therfore Pd metal by
comparing the peaks with standard data by the technique
of X-ray photoelectron spectroscopy.
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