Question

The design criterion for a typical scanning tunneling microscope (STM) specifies that it must be able to detect, on the sample below its tip, surface features that differ in height by only 0.004 90 nm. Assuming the electron transmission coefficient is

e^?2CL   with C = 10.0 nm^?1, what percentage change in electron transmission must the electronics of the STM be able to detect to achieve this resolution?

Answer 1