Process |
Mean |
Sample Standard Deviation (s or σ) |
Lower Spec |
Upper Spec |
A |
29.3 |
0.74 |
26.8 |
31.8 |
B |
119.6 |
2.56 |
115.5 |
132.5 |
Process | Mean | Sample Standard Deviation (s or σ) | Lower Spec | Upper Spec | a. appropriate measure | |
A | 29.3 | 0.74 | 26.8 | 31.8 | Cp | 0.62 |
B | 119.6 | 2.56 | 115.5 | 132.5 | Cpk | 3.50 |
sample size, n | 400 | |||||
Cp is appropriate when the process is centered, i.e. mean lies somewhere between the upper and lower spec, whereas Cpk is more apt for situations where the process is not centered, i.e. the mean tends to shift towards upper or lower spec. | ||||||
in process A, the mean lies between the lower and upper spec, hence, Cp will be a more appropriate measure of process capability | ||||||
in process B, the mean is towards the lower spec, and hence, Cpk will the appropriate measure of process capability | ||||||
Cp= (USL-LSL)/6s | ||||||
Cpk=min [{(USL-mean)/3s}, {(mean-LSL)/3s}] |
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